Equipment Search Test
Looking for customers with sufficient equipment testing capabilities
Instrument Model
Helios 5 CX DualBeam
Supplier
Thermo-Scientific
Application conditions
Semiconductor material defect characterization, device failure analysis and micro-nanostructure design
Instrument Model
Regulus8100 and SU8600
Supplier
Hitachi
Application conditions
Microscopic morphology testing and micro-area element analysis of various samples such as semiconductors, MEMS devices, biology, materials, energy, metals, ceramics, etc.
Instrument Model
IM4000PLUSⅡ and E-3500 ion milling
Supplier
Hitachi
Application conditions
Pre-treatment for SEM and surface analysis (EDX, EBSP, etc.)
Instrument Model
Nicolet iN10 and Nicolet iS50FT-IR
Supplier
Thermo-Scientific
Application conditions
Contaminant identification, failure analysis, competitive analysis, process support
Instrument Model
Confocal Raman Spectrometer
Supplier
Suzhou Weiguang Tanzhen Technology Co., Ltd.
Application conditions
Distribution of physical properties such as components, stress, crystallization rate, etc. in samples in the fields of semiconductors, materials, new energy, criminal investigation, food, etc.
Instrument Model
K-Alpha X-ray Photoelectron Spectrometer (XPS) System
Supplier
Thermo-Scientific
Application conditions
Analysis of elemental composition of materials surface in superconductors, topological insulators, compound semiconductors, semiconductors, catalysis, biology, materials, etc.
Add:5F, Building C, No. 8 Zhining Road, Luzhi, Wuzhong District, Suzhou (215127)
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